Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7551769 | Data structures and algorithms for precise defect location by analyzing artifacts | Sergey Belikov | 2009-06-23 |
| 7538815 | Autofocus system and method using focus measure gradient | Sergey Belikov | 2009-05-26 |
| 7149343 | Methods for analyzing defect artifacts to precisely locate corresponding defects | Sergey Belikov | 2006-12-12 |
| 6840666 | Methods and systems employing infrared thermography for defect detection and analysis | Sergey Belikov | 2005-01-11 |