Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5581491 | High-throughput testing apparatus | Alfred Biwer, Pia Landgraf-Hirschka | 1996-12-03 |
| 5530370 | Testing apparatus for testing and handling a multiplicity of devices | Alfred Biwer | 1996-06-25 |