Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5534786 | Burn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in tests | Kazuo Kaneko, Masayasu Katayama | 1996-07-09 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5534786 | Burn-in and test method of semiconductor wafers and burn-in boards for use in semiconductor wafer burn-in tests | Kazuo Kaneko, Masayasu Katayama | 1996-07-09 |