Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5633828 | Circuitry and methodology to test single bit failures of integrated circuit memory devices | David C. McClure, Mark A. Lysinger, Frank J. Sigmund | 1997-05-27 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5633828 | Circuitry and methodology to test single bit failures of integrated circuit memory devices | David C. McClure, Mark A. Lysinger, Frank J. Sigmund | 1997-05-27 |