SE

Scott A. Earnest

Micron: 1 patents #4,761 of 6,345Top 80%
📍 Nampa, ID: #169 of 306 inventorsTop 60%
🗺 Idaho: #5,199 of 8,810 inventorsTop 60%
Overall (All Time): #3,745,719 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5528603 Apparatus and method for testing an integrated circuit using a voltage reference potential and a reference integrated circuit Robert L. Canella, Greg Stevenson, Dave E. Charlton 1996-06-18