Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12198894 | Measurement system and method of setting parameter of charged particle beam device | Kazuki Ikeda, Wen Li, Masashi Wada | 2025-01-14 |
| 11898974 | Charged particle beam device, computer, and signal processing method for charged particle beam device | Wen Li, Masashi Wada | 2024-02-13 |
| 11848171 | Charged particle beam device and charged particle beam device calibration method | Akio Yamamoto, Wen Li, Shunsuke Mizutani | 2023-12-19 |