Issued Patents All Time
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12209980 | Adsorbate analysis using optically stimulated electron emission | William T. Yost, Daniel F. Perey, Paul Petzar, John W. Connell, Rodolfo I. Ledesma +1 more | 2025-01-28 |
| 12083625 | Laser surface treatment on stainless steel and nickel alloys for adhesive bonding | Xiaomei Fang, Christopher J. Hertel, John D. Riehl, John W. Connell, John W. Hopkins | 2024-09-10 |
| 11590676 | Guided wave-based system for cure monitoring of composites using piezoelectric discs and fiber Bragg gratings/phase-shifted Bragg gratings | Tyler B. Hudson, Fuh-Gwo Yuan, Nicolas Auwaijan | 2023-02-28 |
| 11360053 | Systems and methods for in-situ cure monitoring and defect detection | Tyler B. Hudson, Trenton B. Abbott, Jeffrey P. Seebo, Eric R. Burke | 2022-06-14 |
| 10899045 | High pressure soft lithography for micro-topographical patterning of molded polymers and composites | Vincent Cruz, Christopher J. Wohl, Jr. | 2021-01-26 |
| 10677741 | Laser surface treatment and spectroscopic analysis system | John W. Connell, William T. Yost, John W. Hopkins, Rodolfo I. Ledesma | 2020-06-09 |
| 10549516 | Off-set resin formulations and blocking/deblocking resin systems for use as a “co-cure-ply” in the fabrication of large-scale composite structure | John W. Connell, Christopher J. Wohl, Jr. | 2020-02-04 |
| 10501840 | Influence on surface interactions by substructure topography | Christopher J. Wohl, Jr. | 2019-12-10 |
| 10369767 | Blocking/deblocking resin systems for use as a “co-cure-ply” in the fabrication of large-scale composite structure | John W. Connell, Christopher J. Wohl, Jr. | 2019-08-06 |
| 9815263 | Method for manufacturing a thin film structural system | Wendell Keith Belvin, David W. Sleight, John W. Connell, Thomas J. Burns, Nancy M. Holloway +3 more | 2017-11-14 |
| 7691275 | Use of step and flash imprint lithography for direct imprinting of dielectric materials for dual damascene processing | C. Grant Willson, Yukio Nishimura, Stephen C. Johnson, Michael Stewart | 2010-04-06 |