ZY

Zhongqing You

MA Magnetic Analysis: 1 patents #10 of 16Top 65%
📍 Port Chester, NY: #38 of 72 inventorsTop 55%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,771,480 of 4,157,543Top 95%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
5418459 Method and apparatus for flaw detection using an AC saturating field generated by a first coil and an eddy current sensor second coil Robert A. Brooks, Paul J. Bebick 1995-05-23