Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379197 | Abnormality determination apparatus, abnormality determination method, and abnormality determination system | Yo Terashita, Akira Takada, Shinji Hashimoto, Takuya Komada | 2025-08-05 |
| 10830568 | Measurement device and measurement system | Mitsuru Fukuda, Kazumi Mizukami | 2020-11-10 |