Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11946858 | Examination device | Yoshihiro Satou, Toshio Masuda, Hitoshi Matsuno, Kei Shibayama, Osamu Yoshimura | 2024-04-02 |
| 9018627 | Inspection apparatus | Nobuhiro Kanda, Hiroshi Mukai, Masatoshi Watanabe, Kazuyuki Sugimura, Katsuyasu Inagaki | 2015-04-28 |