Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10957414 | Method of test and repair of memory cells during power-up sequence of memory device | Sangyeol Lee, Jonggeon Lee | 2021-03-23 |
YA
Youngman Ahn
Overall (All Time): #2,717,476 of 4,157,543Top 70%
1
Patents All Time