Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9945887 | Measuring apparatus and measuring method | Hiroyuki Tokusaki, Hiroshi Imai, Keiki Matsuura | 2018-04-17 |
| 9506956 | Flow direction detection device, flow direction detection method, and flow direction detection program | Hiroshi Imai, Ryota Akai, Chen Chen | 2016-11-29 |
| 5654632 | Method for inspecting semiconductor devices on a wafer | — | 1997-08-05 |