Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5589765 | Method for final testing of semiconductor devices | Dale Ohmart, Deogracias D. Marrero, Douglas J. Mirizzi | 1996-12-31 |
| 4517455 | Dual peak detector | Billy R. Masten | 1985-05-14 |