Issued Patents All Time
Showing 1–8 of 8 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11413698 | System and method for monitoring and controlling build quality during electron beam manufacturing | Vincent S. Smentkowski, John Scott Price, Vance Scott Robinson | 2022-08-16 |
| 10502701 | Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process | Adrian Ivan, David Charles Bogdan, JR. | 2019-12-10 |
| 10117626 | Apparatus and method for pile-up correction in photon-counting detector | Geng Fu, Peter Michael Edic, Brian David Yanoff, Jianjun Guo, Yannan Jin | 2018-11-06 |
| 9220469 | Systems and methods for correcting detector errors in computed tomography imaging | Yannan Jin, Peter Michael Edic, Hewei Gao, Geng Fu | 2015-12-29 |
| 8824635 | Detector modules for imaging systems and methods of manufacturing | John Eric Tkaczyk, Kevin Matthew Durocher, James Wilson Rose, Haochuan Jiang, Abdelaziz Ikhlef +1 more | 2014-09-02 |
| 7915583 | Method and system for ultrafast photoelectron microscope | Ahmed H. Zewail | 2011-03-29 |
| 7442931 | Method and system for ultrafast photoelectron microscope | Ahmed H. Zewail | 2008-10-28 |
| 7154091 | Method and system for ultrafast photoelectron microscope | Ahmed H. Zewail | 2006-12-26 |