Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10147659 | Method and structure for process limiting yield testing | Ricardo P. Mikalo, Thomas Merbeth | 2018-12-04 |
| 10048311 | Detection of gate-to-source/drain shorts | Hans-Peter Moll, Ricardo P. Mikalo | 2018-08-14 |
| 9786657 | Semiconductor structure including a transistor including a gate electrode region provided in a substrate and method for the formation thereof | Ricardo Pablo. Mikalo | 2017-10-10 |
| 9257353 | Integrated circuits with test structures including bi-directional protection diodes | Ricardo P. Mikalo | 2016-02-09 |
| 7354684 | Test pattern and method of evaluating the transfer properties of a test pattern | Henning Haffner | 2008-04-08 |