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U-Seock Moon

HC Hantech Co.: 1 patents #5 of 16Top 35%
Overall (All Time): #3,269,093 of 4,157,543Top 80%
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Patent #TitleCo-InventorsDate
8055058 Apparatus and method for detecting defects in wafer using line sensor camera Jong-Kyu Han, Byoung-Moon Hwang, Jin Seob Kim 2011-11-08