Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9761791 | Conductive pad structure and method of fabricating the same | Jian-Bin Shiu | 2017-09-12 |
| 9070652 | Test structure for semiconductor process and method for monitoring semiconductor process | Jian-Bin Shiu | 2015-06-30 |