Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10969434 | Methods and apparatuses to detect test probe contact at external terminals | Yoshinori Fujiwara, Timothy O'Neil | 2021-04-06 |
| 6822915 | Method and circuit for charging a signal voltage through a semiconductor memory device | — | 2004-11-23 |
| 6509598 | Semiconductor memory device having a redundant block and reduced power consumption | — | 2003-01-21 |