Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7441166 | Testing apparatus and testing method | Masuhiro Yamada, Kazuhiko Sato | 2008-10-21 |
| 6513138 | Pattern generator for semiconductor test system | — | 2003-01-28 |
| 5717694 | Fail analysis device for semiconductor memory test system | — | 1998-02-10 |
| 5682393 | Pattern generator for cycle delay | — | 1997-10-28 |
| 5673271 | High speed pattern generator | — | 1997-09-30 |
| 5646948 | Apparatus for concurrently testing a plurality of semiconductor memories in parallel | Shinichi Kobayashi, Tadashi Okazaki, Kazumi Kita, Junichi Kanai, Tadahiko Baba | 1997-07-08 |
| 5644578 | Failure memory device | — | 1997-07-01 |