TM

Tohru Mori

AC Ando Electric Co.: 12 patents #10 of 301Top 4%
NT NTT: 4 patents #1,310 of 4,871Top 30%
FI Fujifilm Business Innovation: 3 patents #2,355 of 5,238Top 45%
YE Yokogawa Electric: 3 patents #261 of 1,441Top 20%
IBM: 2 patents #32,839 of 70,183Top 50%
HI Hitachi: 2 patents #13,388 of 28,497Top 50%
NE Ntt Electronics: 1 patents #160 of 358Top 45%
OC Oki Electric Industry Co.: 1 patents #1,459 of 2,807Top 55%
KC Kanzaki Paper Manufacturing Co.: 1 patents #124 of 211Top 60%
YM Yokogawa Test & Measurement: 1 patents #18 of 33Top 55%
FC Fujisawa Pharmaceutical Co.: 1 patents #444 of 782Top 60%
FC Furukawa Electric Co.: 1 patents #1,242 of 2,370Top 55%
📍 Ikeda, JP: #18 of 425 inventorsTop 5%
Overall (All Time): #163,405 of 4,157,543Top 4%
25
Patents All Time

Issued Patents All Time

Showing 1–25 of 25 patents

Patent #TitleCo-InventorsDate
10754990 Electronic device Gentaro Ishihara 2020-08-25
8645962 Instruction generating apparatus including a receiving section, a determining section, and a generation section, document processing system, and a computer readable medium Daisuke KONO, Akira Hirose, Atsushi Monna, Kazushi Kaneshiro, Tomonari Yamauchi 2014-02-04
7889368 Service processing system, service processing method and service processing device Hiroshi Iida, Kenji Kawase, Hiroomi Ichiba, Satoshi Kaito, Reiko Aoyama +5 more 2011-02-15
7456626 Measurement device and method for displaying measurement result Gentaro Ishihara 2008-11-25
7254743 Service processing system and method Hiroshi Iida, Kenji Kawase, Hiroomi Ichiba, Satoshi Kaito, Reiko Aoyama +5 more 2007-08-07
7022967 Photodetector with plural switched feedback resistors Atsushi Horiguchi 2006-04-04
6898001 Noise figure-measuring device and noise figure-measuring method Gentaro Ishihara 2005-05-24
6879396 Monochromator and optical spectrum analyzer using the same Tsutomu Kaneko, Toshikazu Yamamoto 2005-04-12
6775005 Low-coherence reflectometer with polarization control Fumio Akikuni, Shoichi Aoki, Tetsuo Yano, Kazumasa Takada 2004-08-10
6633380 Wavelength characteristic measurement apparatus Takashi Iwasaki 2003-10-14
6512582 Wavelength tracking system using an optical spectrum analyzer and a wavelength tunable light source Seiji Funakawa 2003-01-28
6480318 Optical amplifier evaluation method and optical amplifier evaluation instrument Masaru Fukushima 2002-11-12
6476919 Polarization-independent reflectometry and polarization-independent reflectometer Kazumasa Takada, Masaharu Horiguchi 2002-11-05
6166805 Double pass monochromator Tsutomu Kaneko, Manabu Kojima 2000-12-26
6057957 Optoacoustic modulator 2000-05-02
5978075 Distance correction method and the controller for the reflectometer 1999-11-02
5917649 Device and a method for evaluating an optical amplifier Masafumi Koga 1999-06-29
5854581 Transaction processing system and transaction processing method Seiji Yoshizawa, Yoshinori Koshida, Shusaku Tanabe, Sinichi Suto, Satoshi Hamasaki 1998-12-29
5808704 Rear projection type image display apparatus Hiroki Yoshikawa, Takahiko Yoshida, Kiyoshi Wada, Shigeru Mori, Tetsu Ohishi +12 more 1998-09-15
5677781 Method and device for measuring a noise figure in optical amplifiers Kazuo Aida 1997-10-14
5019963 Data processing network with upgrading of files Graham Richard Alderson, Peter R. MacFarlane 1991-05-28
4763119 Image processing system for area filling of graphics Shigeru Matsubara, Toshiroh Tabata 1988-08-09
4653103 Loudspeaker structure and system Makoto Kohashi, Yoshio Ariki 1987-03-24
4639751 Image-receiving sheet for heat transfer recording system Takayasu Hongo, Rinzo Kamikura 1987-01-27
4331767 Immobilized enzyme column Takao Nakajima, Masafumi Terada 1982-05-25