Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9562945 | Modifying a scan chain for improved fault diagnosis of integrated circuits | Liang Chen, Guofan Jiang, Yang Liu | 2017-02-07 |
| 9383409 | Method of diagnosable scan chain | Liang Chen, Guofan Jiang, Yang Liu | 2016-07-05 |