Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11650579 | Information processing device, production facility monitoring method, and computer-readable recording medium recording production facility monitoring program | Kazunori Maruyama | 2023-05-16 |
| 11199833 | Quality determination method, quality determination device, quality determination system and computer-readable non-transitory medium | Jun Taniguchi | 2021-12-14 |
| 11054460 | Soft error inspection method, soft error inspection apparatus, and soft error inspection system | — | 2021-07-06 |
| 8780193 | Physical properties measuring method and apparatus | Takashi Yamazaki | 2014-07-15 |
| 8299430 | Electron microscope and observation method | — | 2012-10-30 |
| 7571653 | Stress measuring method and system | — | 2009-08-11 |
| 7342226 | Stress measuring method and system | — | 2008-03-11 |
| 7084400 | Lattice strain measuring system and method | — | 2006-08-01 |
| 6822234 | Method for measuring localized region lattice strain by means of convergent beam electron diffraction, and measurement device thereof | — | 2004-11-23 |