Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11217422 | Charged particle beam system and method of measuring sample using scanning electron microscope | Yoshikazu Nemoto, Yuta MURAKAMI, Akira Abe, Masatsugu Kawamoto, Hiroki Mezaki | 2022-01-04 |