Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12379197 | Abnormality determination apparatus, abnormality determination method, and abnormality determination system | Yo Terashita, Yuuto Karasawa, Akira Takada, Shinji Hashimoto | 2025-08-05 |