Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11493393 | In-situ stress measurement method | Kazuhiko Tezuka, Tetsuya TAMAGAWA | 2022-11-08 |
| 5064711 | Substrate of a hybrid IC, method of forming a circuit pattern and apparatus of forming the same | Akihiro Yoshida, Kazunori Shimazaki, Shuzo Hattori | 1991-11-12 |
| 4951189 | Sequence control system and method | Masayuki Onodera, Tatsuo Naito, Hisashi Kubota, Takayuki Kawakami, Kei Shimizu | 1990-08-21 |
| 4891242 | Substrate of a hybrid ic, method of forming a circuit pattern and apparatus of forming the same | Akihiro Yoshida, Kazunori Shimazaki, Shuzo Hattori | 1990-01-02 |