Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7965093 | Test apparatus and test method for testing a device under test using a multi-strobe | Hiroshi Kurosaki | 2011-06-21 |
| 7783452 | Signal measurement apparatus and test apparatus | Masatoshi Ohashi | 2010-08-24 |
| 6885956 | Semiconductor test apparatus | — | 2005-04-26 |
| 5646948 | Apparatus for concurrently testing a plurality of semiconductor memories in parallel | Shinichi Kobayashi, Toshimi Ohsawa, Tadashi Okazaki, Kazumi Kita, Junichi Kanai | 1997-07-08 |