Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4204159 | Eddy-current test probe with segmented circumferential test gap and method for inspection of materials | Duane P. Johnson | 1980-05-20 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4204159 | Eddy-current test probe with segmented circumferential test gap and method for inspection of materials | Duane P. Johnson | 1980-05-20 |