Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8400181 | Integrated circuit die testing apparatus and methods | — | 2013-03-19 |
| 8386864 | Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces | Prashant Dubey, Akhil Garg | 2013-02-26 |
| 8108744 | Locally synchronous shared BIST architecture for testing embedded memories with asynchronous interfaces | Prashant Dubey, Akhil Garg | 2012-01-31 |