Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11624769 | High-side gate over-voltage stress testing | Benjamin Lee Amey, Patrick Michael Teterud, Hung Quoc Nguyen | 2023-04-11 |
| 11353494 | High-side gate over-voltage stress testing | Benjamin Lee Amey, Patrick Michael Teterud, Hung Quoc Nguyen | 2022-06-07 |
| 10892756 | Reducing noise effects in electrostatic discharge circuits | Benjamin Lee Arney | 2021-01-12 |
| 10613134 | High-side gate over-voltage stress testing | Benjamin Lee Amey, Patrick Michael Teterud, Hung Quoc Nguyen | 2020-04-07 |
| 8975948 | Wide common mode range transmission gate | — | 2015-03-10 |