Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9261468 | Multi-particle inspection using associated particle sources | Philip R. Bingham, John T. Mihalczo, James A. Mullens, Paul A. Hausladen | 2016-02-16 |
| 8586939 | Multiple source associated particle imaging for simultaneous capture of multiple projections | Philip R. Bingham, Paul A. Hausladen, John T. Mihalczo, James A. Mullens | 2013-11-19 |