Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11899959 | Method of testing memory device, memory built-in self test (MBIST) circuit, and memory device for reducing test time | Jaewon Park, Jaehoon Lee | 2024-02-13 |
| 11462373 | Switch apparatus for automobile | Kiwon KIM, Gyuho Kim, Seulgichan Her, Myungjin Song | 2022-10-04 |