Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7715997 | Intelligent inspection based on test chip probe failure maps | Garrett John Long, Pramod Gaud, John Roberts | 2010-05-11 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7715997 | Intelligent inspection based on test chip probe failure maps | Garrett John Long, Pramod Gaud, John Roberts | 2010-05-11 |