Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5612786 | Contour measurement system | Edward D. Huber, Rick A. Williams, Dean M. Shough, Osuk Y. Kwon | 1997-03-18 |
| 5557410 | Method of calibrating a three-dimensional optical measurement system | Edward D. Huber, Rick A. Williams, Dean M. Shough, Osuk Y. Kwon | 1996-09-17 |