Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7902853 | Semiconductor device, semiconductor device testing method, and probe card | Masami Mori | 2011-03-08 |
| 6879174 | Testing method and testing device for semiconductor integrated circuits | — | 2005-04-12 |