Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9703689 | Defect detection using test cases generated from test models | Tomio Amano, Natsumi Kurashima, Hirofumi Matsuzawa, Masaru Yamamoto | 2017-07-11 |
RS
Rei Suginaka
Overall (All Time): #2,954,561 of 4,157,543Top 75%
1
Patents All Time