Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8510616 | Scalable scan-based test architecture with reduced test time and test power | — | 2013-08-13 |
| 7200690 | Memory access system providing increased throughput rates when accessing large volumes of data by determining worse case throughput rate delays | Anindya Saha | 2007-04-03 |