RS

R. Stephen Speer

FI Finisar: 1 patents #409 of 719Top 60%
Overall (All Time): #3,316,191 of 4,157,543Top 80%
1
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
7482828 Methods and apparatus for device testing at the wafer level Andre Lalonde, James K. Guenter 2009-01-27