Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5923178 | Probe assembly and method for switchable multi-DUT testing of integrated circuit wafers | H. Dan Higgins, Martin Martinez | 1999-07-13 |
| 5828226 | Probe card assembly for high density integrated circuits | H. Dan Higgins, Rajiv Pandey, Norman J. Armendariz | 1998-10-27 |