Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11392803 | Decision boundary enhancement for learning models | Richard Daniel Kimmel, David W. Winston, Tong Li | 2022-07-19 |
| 10852351 | Iterative approach to determine failure threshold associated with desired circuit yield in integrated circuits | Tong Li, David W. Winston, Richard Daniel Kimmel | 2020-12-01 |
| 10762166 | Adaptive accelerated yield analysis | David W. Winston, Tong Li, Richard Daniel Kimmel | 2020-09-01 |
| 8239794 | System and method for estimating leakage current of an electronic circuit | Bhavna Agrawal, David J. Hathaway, Karl K. Moody, III, Peng Peng, David W. Winston | 2012-08-07 |