Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10946474 | Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control | Scott Stecker | 2021-03-16 |
| 10071437 | Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control | Scott Stecker | 2018-09-11 |
| 9174300 | Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control | Scott Stecker | 2015-11-03 |
| 8809780 | Electron beam layer manufacturing using scanning electron monitored closed loop control | Scott Stecker | 2014-08-19 |
| 8598523 | Electron beam layer manufacturing using scanning electron monitored closed loop control | Scott Stecker | 2013-12-03 |
| 8461474 | Raster methodology, apparatus and system for electron beam layer manufacturing using closed loop control | Scott Stecker | 2013-06-11 |