Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11946740 | Coating thickness measurement instrument | Simon Trevena Coulton, Alan James Dodd, Maria Isabel Jimenez-Lopez | 2024-04-02 |
| 5886522 | Dual mode coating thickness measuring probe for determining the thickness of a coating on ferrous and non-ferrous substrates | — | 1999-03-23 |