Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12252770 | ECAE processing for high strength and high hardness aluminum alloys | Stephane Ferrasse, Frank C. Alford, Susan D. Strothers | 2025-03-18 |
| 11981991 | Sputter trap having a thin high purity coating layer and method of making the same | Jaeyeon Kim, Susan D. Strothers, Shih-Yao Lin, Michael D. Payton, Scott R. Sayles | 2024-05-14 |
| 11649535 | ECAE processing for high strength and high hardness aluminum alloys | Stephane Ferrasse, Frank C. Alford, Susan D. Strothers | 2023-05-16 |
| 11584985 | Sputter trap having a thin high purity coating layer and method of making the same | Jaeyeon Kim, Susan D. Strothers, Shih-Yao Lin, Michael D. Payton, Scott R. Sayles | 2023-02-21 |
| 11450516 | Large-grain tin sputtering target | Marc D. Ruggiero, Stephane Ferrasse, Frank C. Alford, Susan D. Strothers | 2022-09-20 |
| 11421311 | ECAE materials for high strength aluminum alloys | Stephane Ferrasse, Wayne D. Meyer, Frank C. Alford, Marc D. Ruggiero, Susan D. Strothers | 2022-08-23 |
| 11248286 | ECAE materials for high strength aluminum alloys | Stephane Ferrasse, Susan D. Strothers, Marc D. Ruggiero, Wayne D. Meyer, Lucia M. Feng +1 more | 2022-02-15 |
| 11035036 | Method of forming copper alloy sputtering targets with refined shape and microstructure | Stephane Ferrasse, Frank C. Alford, Ira G. Nolander, Erik L. Turner | 2021-06-15 |
| 10968510 | Sputter trap having multimodal particle size distribution | Jaeyeon Kim, Susan D. Strothers, Michael D. Payton, Scott R. Sayles | 2021-04-06 |
| 10851447 | ECAE materials for high strength aluminum alloys | Stephane Ferrasse, Wayne D. Meyer, Frank C. Alford, Marc D. Ruggiero, Susan D. Strothers | 2020-12-01 |
| 10760156 | Copper manganese sputtering target | Stephane Ferrasse, Frank C. Alford, Susan D. Strothers, Ira G. Nolander, Michael R. Pinter | 2020-09-01 |
| 10655212 | Sputter trap having multimodal particle size distribution | Jaeyeon Kim, Susan D. Strothers, Michael D. Payton, Scott R. Sayles | 2020-05-19 |