Issued Patents All Time
Showing 1–19 of 19 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9952161 | Methods for obtaining and analyzing digital interferometric data for computer testing and developing semiconductor and anisotropic devices and materials | — | 2018-04-24 |
| 9366719 | Optical to optical methods enhancing the sensitivity and resolution of ultraviolet, electron beam and ion beam devices | — | 2016-06-14 |
| 9250064 | Multiple beam transmission interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor and anisotropic devices | — | 2016-02-02 |
| 8879071 | Multiple optical wavelength interferometric testing methods for the development and evaluation of subwavelength sized features within semiconductor devices and materials, wafers, and monitoring all phases of development and manufacture | — | 2014-11-04 |
| 8736823 | Methods and processes for optical interferometric or holographic test in the development, evaluation, and manufacture of semiconductor and free-metal devices utilizing anisotropic and isotropic materials | — | 2014-05-27 |
| 8462350 | Optically enhanced holographic interferometric testing methods for the development and evaluation of semiconductor devices, materials, wafers, and for monitoring all phases of development and manufacture | — | 2013-06-11 |
| 8405823 | Optical to optical infrared imaging detection system | — | 2013-03-26 |
| 8139228 | Methods for optically enhanced holographic interferometric testing for test and evaluation of semiconductor devices and materials | — | 2012-03-20 |
| 8040521 | Holographic condition assessment system for a structure including a semiconductor material | — | 2011-10-18 |
| 7773230 | Interferometric condition assessment system for a microelectronic structure including a semiconductor or free-metal material | — | 2010-08-10 |
| 7733499 | Method for optically testing semiconductor devices | — | 2010-06-08 |
| 7728958 | Condition assessment method for a structure including a semiconductor material | — | 2010-06-01 |
| 7420687 | Condition assessment system for a structure including a semiconductor material | — | 2008-09-02 |
| 7400411 | Method for optically testing semiconductor devices | — | 2008-07-15 |
| 7323889 | Voltage testing and measurement | Kevin Russell | 2008-01-29 |
| 7206078 | Non-destructive testing system using a laser beam | Michael Mauck | 2007-04-17 |
| 6972577 | Voltage testing and measurement | Kevin Russell | 2005-12-06 |
| 6803777 | Voltage testing and measurement | Kevin Russell | 2004-10-12 |
| 6512385 | Method for testing a device under test including the interference of two beams | Kevin Russell | 2003-01-28 |