Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10436874 | Self-calibration of source-measure unit via capacitor | Christopher G. Regier | 2019-10-08 |
| 10175334 | Self-calibration of source-measure unit via capacitor | Christopher G. Regier | 2019-01-08 |
| 9910074 | Digital approach to the removal of AC parasitics for impedance measurements | Blake A. Lindell, Christopher G. Regier | 2018-03-06 |
| 9651585 | Via layout techniques for improved low current measurements | John G. Banaska | 2017-05-16 |