Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5109430 | Mask alignment and measurement of critical dimensions in integrated circuits | H. Keith Nishihara | 1992-04-28 |
| 5062567 | Lead design to facilitate post-reflow solder joint quality inspection | H. Keith Nishihara, Neil D. Hunt, J. Martin Tenenbaum | 1991-11-05 |
| 4965842 | Method and apparatus for measuring feature dimensions using controlled dark-field illumination | H. Keith Nishihara | 1990-10-23 |
| 4924506 | Method for directly measuring area and volume using binocular stereo vision | H. Keith Nishihara, Neil D. Hunt | 1990-05-08 |
| 4704342 | Photomask having a patterned carbon light-blocking coating | William I. Lehrer | 1987-11-03 |