Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12050187 | Dual source X-ray inspection system and method | Avishai Shklar, Yeroslav Berezin | 2024-07-30 |
| 11969276 | Dual head X-ray inspection system | Kiyoshi Ogata, Avishai Shklar, Doron Reinis | 2024-04-30 |