Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12221229 | System and method for measuring localized characteristics of a transparency | James W. Brown, JR., John Joseph Haake, Xue Liu, Anthony C. Roberts, Matthew M. Thomas +1 more | 2025-02-11 |
| 10634700 | Dual stripline test fixture apparatuses and methods | Lydell L. Frasch | 2020-04-28 |
| 9958524 | Probe calibration devices and methods | Lydell L. Frasch | 2018-05-01 |