NK

Naotaka Kuroda

NE Nec: 7 patents #2,006 of 14,502Top 15%
Rohm Co.: 3 patents #810 of 2,292Top 40%
RE Renesas Electronics: 2 patents #1,855 of 4,529Top 45%
HC Hitachi Cable: 1 patents #530 of 1,086Top 50%
MC Mochida Pharmaceutical Co.: 1 patents #173 of 309Top 60%
NE Nec Electronics: 1 patents #715 of 1,789Top 40%
Overall (All Time): #369,562 of 4,157,543Top 9%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
12038468 Method for measuring current-voltage characteristic Tatsuya YANAGI, Hirotaka OTAKE, Hiroyuki Sakairi 2024-07-16
10908204 Method for measuring current-voltage characteristic Tatsuya YANAGI, Hirotaka OTAKE, Hiroyuki Sakairi 2021-02-02
10901024 Method for measuring current-voltage characteristic Tatsuya YANAGI, Hirotaka OTAKE, Hiroyuki Sakairi 2021-01-26
9954087 Field effect transistor, and multilayered epitaxial film for use in preparation of field effect transistor Takashi Inoue, Tatsuo Nakayama, Yuji Ando, Yasuhiro Murase, Kazuki Ota +4 more 2018-04-24
8853666 Field effect transistor, and multilayered epitaxial film for use in preparation of field effect transistor Takashi Inoue, Tatsuo Nakayama, Yuji Ando, Yasuhiro Murase, Kazuki Ota +4 more 2014-10-07
8476756 Semiconductor device and heat sink with 3-dimensional thermal conductivity Akio Wakejima, Masahiro Tanomura, Hironobu Miyamoto 2013-07-02
8466495 Field effect transistor with reduced gate leakage current Yuji Ando, Hironobu Miyamoto, Tatsuo Nakayama, Yasuhiro Okamoto, Takashi Inoue +3 more 2013-06-18
8332190 Circuit simulator, circuit simulation method and program Masahiro Tanomura, Masafumi Kawanaka 2012-12-11
8198652 Field effect transistor with reduced gate leakage current Yuji Ando, Hironobu Miyamoto, Tatsuo Nakayama, Yasuhiro Okamoto, Takashi Inoue +3 more 2012-06-12
8063484 Semiconductor device and heat sink with 3-dimensional thermal conductivity Akio Wakejima, Masahiro Tanomura, Hironobu Miyamoto 2011-11-22
7741700 Transistor with heat dissipating means Masahiro Tanomura, Naoto Kurosawa 2010-06-22
6824610 Process for producing gallium nitride crystal substrate, and gallium nitride crystal substrate Masatomo Shibata 2004-11-30
5744307 Method for measuring adenyl group-containing susbstances Kenichiro Nakashima, Shuzo Akiyama, Kamon Shirakawa, Naofumi Sato, Toshinori Kanamori 1998-04-28