Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7415378 | Methods for analyzing critical defects in analog integrated circuits | Martin B. Mollat, Tony Phan, Kyle Flessner | 2008-08-19 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7415378 | Methods for analyzing critical defects in analog integrated circuits | Martin B. Mollat, Tony Phan, Kyle Flessner | 2008-08-19 |