MA

Mihoko Akiyama

RE Renesas Electronics: 13 patents #207 of 4,529Top 5%
ML Mitsubishi Electric Engineering Company, Limited: 12 patents #8 of 352Top 3%
Mitsubishi Electric: 8 patents #3,714 of 25,717Top 15%
RT Renesas Technology: 5 patents #592 of 3,337Top 20%
Ricoh Company: 3 patents #4,826 of 9,818Top 50%
📍 Itami, JP: #78 of 1,436 inventorsTop 6%
Overall (All Time): #125,119 of 4,157,543Top 4%
30
Patents All Time

Issued Patents All Time

Showing 1–25 of 30 patents

Patent #TitleCo-InventorsDate
10121541 Semiconductor device and information processing system Futoshi Igaue, Kenji Yoshinaga, Naoya Watanabe 2018-11-06
9620214 Content addressable memory with reduced power consumption and increased search operation speed Naoya Watanabe, Isamu Hayashi, Teruhiko Amano, Fukashi Morishita, Kenji Yoshinaga +3 more 2017-04-11
9159376 Content addressable memory device 2015-10-13
9042148 Content addressable memory Naoya Watanabe, Isamu Hayashi, Teruhiko Amano, Fukashi Morishita, Kenji Yoshinaga +3 more 2015-05-26
8780599 Content addressable memory device 2014-07-15
8638583 Content addressable memory Naoya Watanabe, Isamu Hayashi, Teruhiko Amano, Fukashi Morishita, Kenji Yoshinaga +3 more 2014-01-28
8638599 Semiconductor storage device 2014-01-28
8599639 Semiconductor device including internal voltage generation circuit Futoshi Igaue, Kenji Yoshinaga, Masashi Matsumura, Fukashi Morishita 2013-12-03
8451678 Semiconductor device including internal voltage generation circuit Futoshi Igaue, Kenji Yoshinaga, Masashi Matsumura, Fukashi Morishita 2013-05-28
8400803 Content addressable memory device 2013-03-19
8310852 Content addressable memory Naoya Watanabe, Isamu Hayashi, Teruhiko Amano, Fukashi Morishita, Kenji Yoshinaga +3 more 2012-11-13
8164934 Content addressable memory Naoya Watanabe, Isamu Hayashi, Teruhiko Amano, Fukashi Morishita, Kenji Yoshinaga +3 more 2012-04-24
8004923 Semiconductor device including internal voltage generation circuit Futoshi Igaue, Kenji Yoshinaga, Masashi Matsumura, Fukashi Morishita 2011-08-23
7656736 Semiconductor device including internal voltage generation circuit Futoshi Igaue, Kenji Yoshinaga, Masashi Matsumura, Fukashi Morishita 2010-02-02
7408818 Semiconductor device undergoing defect detection test Kenji Yoshinaga, Masashi Matsumura, Futoshi Igaue, Fukashi Morishita 2008-08-05
7023754 Semiconductor device having standby mode and active mode Fukashi Morishita 2006-04-04
6781431 Clock generating circuit Yasuhiko Taito, Akira Yamazaki, Fukashi Morishita, Nobuyuki Fujii, Mako Okamoto 2004-08-24
6777707 Semiconductor integrated circuit with voltage down converter adaptable for burn-in testing Akira Yamazaki, Fukashi Morishita, Yasuhiko Taito, Nobuyuki Fujii, Mako Okamoto 2004-08-17
6768354 Multi-power semiconductor integrated circuit device Akira Yamazaki, Fukashi Morishita, Yasuhiko Taito, Nobuyuki Fujii, Mako Kobayashi 2004-07-27
6700434 Substrate bias voltage generating circuit Nobuyuki Fujii, Fukashi Morishita, Akira Yamazaki, Mako Kobayashi, Yasuhiko Taito 2004-03-02
6614270 Potential detecting circuit having wide operating margin and semiconductor device including the same Mako Okamoto, Yasuhiko Taito, Fukashi Morishita, Akira Yamazaki, Nobuyuki Fujii 2003-09-02
6515461 Voltage downconverter circuit capable of reducing current consumption while keeping response rate Fukashi Morishita, Akira Yamazaki, Yasuhiko Taito, Mako Kobayashi, Nobuyuki Fujii 2003-02-04
6472926 Internal voltage generation circuit Yasuhiko Taito, Akira Yamazaki, Fukashi Morishita, Mako Kobayashi, Nobuyuki Fujii 2002-10-29
6429729 Semiconductor integrated circuit device having circuit generating reference voltage Mako Kobayashi, Fukashi Morishita, Yasuhiko Taito, Akira Yamazaki, Nobuyuki Fujii 2002-08-06
6424134 Semiconductor integrated circuit device capable of stably generating internal voltage independent of an external power supply voltage Fukashi Morishita, Akira Yamazaki, Yasuhiko Taito, Nobuyuki Fujii, Mako Kobayashi 2002-07-23